The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'06)

The 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'06)- 4 October - 6 October, 2006, Arlington/Washington DC, USA. Annual symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. Includes speaker and registration and history.